MIL-PRF-1/7J
7. The test circuit to be used is shown in figure 1.
FIGURE 1. Test circuit.
8. This test shall be conducted on the initial lot and thereafter on a lot approximately every 12 months. When one lot has
passed, the 12-month rule shall apply. In the event of lot failure, the lot shall be rejected and the succeeding lots shall be
subjected to this test until a lot passes.
9. In a full-wave life-test circuit, the values specified for R1 and C1 may be considered as approximate and shall be adjusted
initially to give not less than Io = 18 mA dc and ib = 50 ma per anode with a bogey tube. Ehk = Eo + 117 V ac.
10. Envelope temperature (TE) requirements, when measured in accordance with the temperature by conduction-band
measurement (MIL-STD-1311, method 1226), will be satisfied if a tube having Etd = 10 V dc (±5 percent) at Is = 60 mA dc
per anode, under normal test conditions, is determined to operate at or above minimum specified temperature at any position
in the life-test rack.
11. This specification sheet uses accept on zero defect sampling in accordance with MIL-PRF-1, table III.
12. Revision letters are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness
of the changes.
Referenced documents: In addition to MIL-PRF-1, this specification sheet references MIL-STD-1311.
Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous
issue due to the extent of the changes.
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