MIL-PRF-1/292F
TABLE I. Requirement or test - Continued.
NOTES:
1.
The maximum voltage appearing between any pair of pins shall be no greater than the peak inverse anode
voltage rating.
2.
Test each unit separately.
3.
In a full-wave circuit, adjust Zp/a so that Io = 10 mA dc with a TUT having an Etd of 5.5 V dc at 15 mA dc per
anode. The minimum peak anode current shall be 25 mA per anode. Tap and reject for recurring arcs or
sputters.
4.
This test shall be performed at the conclusion of the holding period.
5.
This test shall be conducted on the initial lot and thereafter on a lot approximately every 12 months. In the
event of lot failure, the lot shall be rejected and the succeeding lots shall be subjected to this test until a lot has
passed. When one lot has passed, the 12-month rule shall apply.
6.
Envelope temperature (TE) requirements, when measured in accordance with the temperature by conduction-
band measurement (MIL-STD-1311, method 1226), will be satisfied if a TUT having bogey Ib (± 5 percent)
under normal test conditions, is determined to operate at or above minimum specified temperature at any
position in the life-test rack.
7.
In a full-wave life-test circuit, the values of R1 and C1 shall be considered as approximate and shall be
adjusted initially so that Io is equal to or greater than 10 mA dc with ib equal to or greater than 25 mA.
8.
See "Reduced pressure (altitude) rating", and altitude, maximum peak voltage in the basic document.
9.
The life test sample shall consist of 20 tubes per lot and not one tube failure shall be permitted. In the event of
rejection of the first sample, a second sample of 40 tubes shall be selected from the lot. Acceptance shall be
based on the second sample and shall not permit any tube failures.
4
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business