MIL-PRF-1/263G
TABLE I. Testing and Inspection. -Continued.
Rating chart III (see figure 3). This chart shows the minimum value of anode supply resistance (Rs) required to
c.
remain within the transient peak-anode-current rating. The value of Rs should be such that it lies to the left of the line
on the rating chart at the highest probable value of line voltage. Rating chart III applies to capacitor-input filter
operation only.
d.
Rating chart IV (see figure 4). This chart presents the maximum ratings for ac anode supply voltage and altitude.
Rating chart IV refers to both capacitor-input filter and choke-input filter operation.
2. All values of Epp/a refer to the unloaded supply voltage. The ratings refer to rectifier operation with sinusoidal supply voltages
within the frequency range of 25 to 1,000 Hz.
3. Test each section separately.
4. In a full-wave circuit, adjust Zp/a so that a bogey tube gives Io = 55 mA dc. A bogey tube has a tube drop of Etd = 22 V dc at
Is = 50 mA dc per anode. Ehk = Eo.
5. This test shall be performed at the conclusion of the holding period.
6. This test shall be conducted on the initial lot and thereafter on a lot approximately every 12 months. In the event of lot failure,
the lot shall be rejected and the succeeding lots shall be subjected to this test until a lot passes. When one lot has passed,
the 12 month rule shall apply.
7. Acceptance sampling procedure shall be in accordance with "Base-strain test, miniature, sampling (MIL-STD-1311, method
1121)", except that data covered in "Acceptance and rejection criteria" shall be modified as follows:
a.
Accepted if no defective for class "A", "B", or "C" defects, respectively (see MIL-STD-1311, method 1121), or if no
defectives are found in the sample.
b.
Rejected if any defectives for class "A", "B", or "C" defects, respectively, or if any defectives are found in the sample.
8. In a full-wave life-test circuit, the values specified for R1 and CL may be considered as approximate and shall be adjusted
initially to give not less than Io = 55 mA dc and ib/a = 200 ma with a bogey tube (see note 4). Ehk = Eo.
9. The life-test sample shall consist of 20 tubes per lot and no failures shall be permitted. In the event of rejection of the first
sample, due to failure, a second sample of the lesser of 20 tubes or 10 percent of lot size shall be selected from the lot.
Acceptance shall then be based on the second sample and no tube failures shall be permitted.
10. Envelope temperature (TE) requirements, when measured in accordance with the temperature by conduction-band
measurement (MIL-STD-1311, method 1226), will be satisfied if a tube having bogey Etd (±10 percent at Is = 50 mA dc per
anode) under normal test conditions, is determined to operate at or above minimum specified temperature at any position in
the life-test rack.
11. This specification sheet utilizes an accept on zero defect sampling plan in accordance with MIL-PRF-1, table III.
12. Revision letters are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of
the changes.
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